®® INNOVATION and EX C ELL E N C E DTL5A-LC DTL5A-LC DTL5A-LC DTL5A-LC DTL5A-LC 100 Watt, Serial-Input Electronic Load Low Compliance Version Features DATEL's DTL5A-LC is a serial-input controlled electronic loads featuring a low compliance voltage operation (down to 0.6 Volts)! Similar to DATEL's DTL3A, the · Serial-input controlled DTL5A-LC also offers a loading current range of 0 to 2.0A full scale range with a loading · 100 watts maximum load capacity voltage to 50V. The DTL5A-LC's ability to operate down to 0.6 Volts, allows this device to · 0.6 to 50V, 0 to 2.0A capability be used with next-generation, low-voltage output power supplies. The DTL3A's · Parallel load capability for higher compliance voltage operates from 2.5 Volts to 50 Volts, sufficient for today's 2.5V, 3.3V, 5 Volt, etc., power product voltages, with improved gain specifications. current and power applications · Dynamic loading to 20 kHz The small but efficient heat transfer package allows up to 100W of power dissipation · Compliance Voltage down to 0.6 Volts by using external heatsinking. The devices are packaged in a small 2" x 2" x 0.4" metal package, providing easy mounting capability for external heatsinks. A monitor circuit makes sure a compliance voltage is present, before biasing the DTL5A-LC's output Applications stage. A Fault line goes active, should the device-under-test go below its compliance voltage. · Power supply test and characterization These loads feature fast current step response times, settling a full scale step in 100 · Dynamic power supply burn-in μsec to ±1% Full Scale Range (FSR). Dynamic loading is up to 20kHz, and a current · Battery capacity testing resolution of ±0.025% is achieved. Opto-isolators are utilized on the digital input lines, · Current source testing with 500 Volts of isolation provided from the load outputs to input ground. The opto- · Capacitor discharge testing isolators are internally buffered, making the DTL5A-LC easy to drive, with any digital I/O · Power resistor substitution board. Isolation from any pin to case is 500 Volts. · Real-time load simulation +5V Supply Ground 32 Isolated DC/DC Converter 11 7 +Load Input Control Strobe (CS) 10 +Load Input 6 Clock (CLK) 4 Amplifier/ Buffers/ D/A Power Supply Current Opto Converter Under Test 5 Sensor Serial Data In (SDI) Isolators –Load Input 9 4 Latch Data (LD) –Load Input 8 1 Error Fault Detection Figure 1. Simplified Schematic DATEL, Inc., Mansfield, MA 02048 (USA) • T el: (508)339-3000, (800)233-2765 Fax: (508)339-6356 • Email: sales@datel.com • Internet: www.datel.com 100 Watt Serial-Input Electronic Loads DTL5A-LC ➀ Performance Specifications and Ordering Guide Output Compliance Package Model Voltage Loading Curent Current Resolution Accuracy Offset Error Gain Error Gain Error (Case (Volts) (Amperes) mA (%FSR) (%FSR) (mA) (% of Setting) Pinout) DTL5A-LC 0.6 to 50 0 to 2.0 0.5 ±3 ±0.05 50 ±0.25 C1 ➀Typical at TA = +25°C under nominal line voltage and full-load conditions unless otherwise noted. Mechanical Specifications Case C1 Part Number Structure #4-40 CLEAR THRU - DTL 5 A LC (TYP 4 PL )� Prefix: A-Series DTL = DATEL product High Reliability Metal Shell Aluminum Header Voltage Range/Current: LC = Low Compliance: 5 = 2.5 to 50V, 0 to 2A Voltage Range of 0.6 to 50V DTL5A-LC model only ±0.20 Min .±0.001 ±0.001 Pins Pins The warranty period is one year 2.02 Max. A 1.800����� A B 1.640 Temperature Derating �� � �� � ��� � 100��� B����� 80 Load 60 Capacity 7 8 in Watts 40 6 5 9 20 4 BOTTOM VIEW (Label/pin side) 3 10 0 10 20 25 30 40 50 60 70 80 90 100 2 Base Plate Temperature in °C 1 11 I/O Connections Note: Pin Function Pin Function The DTL5A-LC electronic load packaging has been designed to allow for use with external heatsinking for high wattage applications. The DTL5A-LC can 1 Fault 8 - Load Input dissipate up to 100 Watts with external cooling (heatsink or fan) observing the 2 Ground 9 - Load Input base plate temperature requirements above. The loads are capable of dissipating 5 Watts at room temperature without any external cooling. 3 +5 Volts Supply 10 + Load Input The devices can also be connected in parallel for additional loading capability. 4 Latch Data (LD) 11 + Load Input 5 Serial Data In (SDI) 6 Clock (CLK) 7 Control Strobe (CS) 2 2.02 Max. 1.200 1.000 .800 .600 .400 .200 .220 1.640 100 Watt Serial-Input Electronic Loads DTL5A-LC Performance/Functional Specifications Typical @ TA = +25°C under nominal line voltage and full-load conditions unless noted. Timing Min. Typ. Max. Units Input Min. Typ. Max. Units Refer to timing diagram: Digital Inputs (pins 4, 5, 6, 7): V 0.8 Volts CLK 200 kHz IL V 2.0 Volts IH t = t 1 μsec I -0.6 mA cl ch IL t 1 μsec I 20 μA css IH t 1 μsec Output csh t 2 μsec Loading Current See Ordering Guide ld1 t 2 μsec Current Resolution ±0.025 % FSR ld2 t 2 μsec Offset Error ±0.05 % FSR ldw t 0.5 μsec Gain Error ds DTL5A-LC ±0.3 % FSR t 0.5 μsec dh Compliance Voltage Range See Ordering Guide Output Impedance 10 Mohm Absolute Maximum Ratings Dynamic Characteristics These are stress ratings. Exposure of devices to any of these conditions may Dynamic Loading to: 20 kHz adversely affect long-term reliability. Proper operation under conditions other Settling Time than those listed in the Performance/Functional Specifications Table is not (Full Scale Step) 100 usec implied. Slew Rate 10 A/μsec Power Power Supply Voltage (pin3): 5.5 Volts +5 Volts Supply (pin 3) +4.75 +5.0 +5.25 Volts Current (pin 3) +110 +150 mA Digital Input Voltage (pins 4,5,6,7): 5.5 Volts Environmental Output Reverse-Polarity Protection: No protection Operating Ambient Temp- erature Ta, where no de- Output Overvoltage Protection: No protection rating required. Natural Convection, vertical mount Storage Temperature –40 to +105°C Storage T emperature –40 +105 °C Lead Temperature (soldering, 10 sec.) +300°C Humidity (Non-condensing) 95 % Altitude Above Sea Level 10,000 feet Physical Dimensions 2" x 2" x 0.52" (51 x 51 x 12.7mm) Pin Length 0.2 inches Shielding 6-sided Case Material Tin-plated Steel Shell Heat-sink side: Aluminum Pin Material Brass, solder coated Isolation, ± Load to Input Ground 500 Volts Isolation, any pin to case 500 Volts Isolation, resistance 100 Mohm Mounting Through-hole spacer, #4-40 clearance Weight 1.9 ounces (55 grams) 3 100 Watt Serial-Input Electronic Loads DTL5A-LC Overview Software: C Language The following steps describe a typical timing sequence when The DTL5A-LC is a serial-input controlled current sink. Powered by a single +5V using four lines of a parallel digital I/O port and a programming power supply, the DTL5A-LC provides a compliance voltage range from 0.6 _ language such as C. Using 4 bits of an 8-bit port, assign BIT 0 Volts to 50 Volts, with loading currents to 2.0 Amperes. Refer to the Table of _ (LSB) to the Control Strobe (CS, pin 7), BIT 1 to the basic "Mapping of the Serial-Input Data Word to the Loading Current for the Latch Data (LD, pin 4), BIT_2 to Serial Data In (SDI, pin 5) and devices transfer function. Utilizing external heatsinking, the device handles BIT_3 to the Clock (CLK, pin 6). loads to 100 watts with a base-plate temperature of 25°C, derating thereafter (only 5 Watts without external heatsink/cooling. Refer to the "Temperature 1. Initialize with Latch Data, Clock, and Control Strobe HIGH. Derating" curve figure herein that illustrates the load capacity in Watts, as a BIT_0 = 1, BIT_1 = 1, BIT_2 = X (don’t care), BIT _3 = 1 function of the base plate temperature. 2. Place the Control Strobe LOW. The Device Under Test (DUT) outputs are hooked up to the +Load Input (pins 10 & 11) and the - Load Input (pins 8 & 9). An input serial data stream (Pin 5) BIT_0 = 0 and clock (Pin 6) are opto-isolated internally. These isolated inputs are gated through to a 12-bit serial input D/A, where the input word can be latched using 3. Place D11 (MSB) of the Data Word into Serial Data In. Latch Data input (Pin 4). A Fault ouput pin (Pin 1) indicates excessive heat the BIT_2 = 0 or 1 or operation outside the compliance range. 4. Toggle the Clock HIGH-LOW-HIGH BIT_3 =1-to-0-to-1 Operation Overview 5. Place D10 of the Data Word into Serial Data In. Programming is easily accomplished by utilizing four lines of a parallel digital I/O BIT_2 = 0 or 1 port. The four digital outputs will be used to control the Control Strobe (CS, pin7), the Latch Data (LD, pin 4), the Serial Data In (SDI, pin 5) and the Clock 6. Toggle the Clock High-LOW-HIGH. (CLK, pin 6) functions of the DTL5A-LC Series. BIT_3 = 1-to-0-to-1 7. REPEAT this process (steps 5 and 6) for the remaining data Initialization bits (D9-D0). Initialization of the device is accomplished by first setting the Control Strobe, 8. Set the Control Strobe High. Clock and Latch Data pins to a Logic High ("1") state. The Serial Data In state Bit_0 = 1 at this time is "Don’t Care". Next, bring the Control Strobe pin to a Logic Low ("0") state. The load is now prepared to accept a serial input word. 9. Toggle the Latch Data High-LOW-HIGH BIT_1 = 1-to-0-to-1 Input of Serial Data After initialization, a serial-input data word representing the desired load current is input to the load. This is accomplished with a data stream that begins with Serial-Input Data Word Load Current (Amperes) the Most Significant Bit (MSB). With the MSB present on the Serial Data In MSB LSB DTL5A-LC (pin 5), toggle the Clock (pin 6) through a High-Low-High state sequence. 1111 1111 1111 1.9995 Similarly, proceed from the MSB to the LSB bits, toggling the Clock (pin 6) 1100 0000 0000 1.5000 through a High-Low-High state for each bit. The timing specifications shown in the "Timing Diagram" should be observed in transitioning the clock states. 1000 0000 0000 1.000 0111 1111 1111 0.9995 Latching the Data Word 0100 0000 0000 0.5000 Upon entering the final, Least Significant Bit (LSB), the serial-input data word is 0010 0000 0000 0.2500 Control Strobe (pin 7) high and then toggling the Latch latched, by bringing the 0000 0000 0001 0.0005 Data (pin 4) through a High-Low-High state sequence. 0000 000 0000 0.000 Mapping of the Serial-Input Data Word to Load Current 4 100 Watt Serial-Input Electronic Loads DTL5A-LC tdh SDI D 11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0 tds CLK tcl tcss tcsh tch CS tld2 tld1 LD ldw t Timing Diagram Load Regulation 5 DTL5A-LC 100 Watt Serial-Input Electronic Load Quality and Reliability stepped up again and the cycle is repeated until the "fundamental limit of the The DTL5A-LC is one of the first Electronic Loads to emerge from DATEL’s technology" is determined. new, company-wide approach to designing and manufacturing the most reliable DATEL has invested in a Qualmark OVS-1 HALT tester capable of applying power products available. The five-pronged program draws our Quality voltage and temperature extremes as well as 6-axis, linear and rotational, Assurance function into all aspects of new-product design, development, random vibration. A typical HALT profile (shown above) consists of thermal characterization, qualification and manufacturing. cycling (–55 to +125°C, 30°C/minute) and simultaneous, gradually Design for Reliability increasing, random longitudinal and rotational vibration up to 20G’s with load cycling and applied-voltage extremes added as desired. Many devices in Design for Reliability is woven throughout our multi-phased, new-product- DATEL’s new A-Series could not be made to fail prior to reaching either the development process. Design-for-reliability practices are fully documented limits of the HALT chamber or some previously known physical limit of the and begin early in the new-product development cycle with the following device. We also use the HALT chamber and its ability to rapidly cool devices goals: to verify their "cold-start" capabilities. 1. To work from an approved components/vendors list ensuring the use of reliable components and the rigorous qualification of new components. Qualification 2. To design with safety margins by adhering to a strict set of derating For each new product, electrical performance is verified via a comprehensive guidelines and performing theoretical worst-case analyses. characterization process and long-term reliability is confirmed via a rigorous 3. To locate potential design weaknesses early in the product-development qualification procedure. The qual procedure includes such strenuous tests cycle by using extensive HALT (Highly Accelerated Life Testing). as thermal shock and 500 hour life. Qual testing is summarized below. 4. To prove that early design improvements are effective by employing a thorough FRACA (Failure Reporting Analysis and Corrective Action) system. Qualification Testing HALT Testing Qualification Test Method/Comments The goal of the accelerated-stress techniques used by DATEL is to force HALT DATEL in-house procedure device maturity, in a short period of time, by exposing devices to excessive High Temperature Storage Max. rated temp., 1,000 hours levels of "every stimulus of potential value." We use HALT (Highly Acceler- Thermal Shock 10 cycles, –55 to +125°C ated Life Testing) repeatedly during the design and early manufacturing Temperature/Humidity +85°C, 85% humidity, 48 hours phases to detect potential electrical and mechanical design weaknesses Lead Integrity DATEL in-house procedure that could result in possible future field failures. Life Test +70°C, 500 hours* During HALT, prototype and pre-production electronic loads are subjected to Marking Permanency DATEL in-house procedure progressively higher stress levels induced by thermal cycling, rate of tempera- End Point Electrical Tests Per product specification ture change, vibration, power cycling, product-specific stresses (such as dc * Interim electrical test at 200 hours. voltage variation) and combined environments. The stresses are not meant to simulate field environments but to expose any weaknesses in a product’s In-Line Process Controls and Screening electro/mechanical design and/or assembly processes. The goal of HALT is to A combination of statistical sampling and 100% inspection techniques keeps make products fail so that device weaknesses can be analyzed and strength- our assembly line under constant control. Parameters such as solder-paste ened as appropriate. Applied stresses are continually stepped up until products thickness, component placement, cleanliness, etc. are statistically sampled, eventually fail. After corrective actions and/or design changes, stresses are charted and fine tuned as necessary. Visual inspections are performed by trained operators after pick-and-place, soldering and cleaning operations. Typical HALT Profile Units are 100% electrically tested prior to potting. All devices are tempera- ture cycled, burned-in, hi-pot tested and final-electrical tested prior to external visual examination, packing and shipping. Rapid Response to Problems DATEL employs an outstanding corrective-action system to immediately address any detected shortcomings in either products or processes. Whenever our assembly, quality or engineering personnel spot a product/ process problem, or if a product is returned with a potential defect, we immediately perform a detailed failure analysis and, if necessary, undertake corrective actions. Over time, this system has helped refine our assembly operation to yield one of the lowest product defect rates in the industry. Test Time (minutes) ® ® ISO 9001 ISO 9001 DS-DTL005 Rev_A 1/2000 INNOVATION and EXC ELLE N C E DATEL, Inc. 11 Cabot Boulevard, Mansfield, MA 02048-1151 DATEL (UK) LTD. Tadley, England Tel: (01256)-880444 DATEL S.A.R.L. Montigny Le Bretonneux, France Tel: 01-34-60-01-01 Tel: (508) 339-3000 (800) 233-2765 Fax: (508) 339-6356 DATEL GmbH München, Germany Tel: 89-544334-0 Internet: www.datel.com Email: sales@datel.com DATEL KK Tokyo, Japan Tel: 3-3779-1031, Osaka Tel: 6-354-2025 Data Sheet Fax Back: (508) 261-2857 DATEL makes no representation that the use of its products in the circuits described herein, or the use of other technical information contained herein, will not infringe upon existing or future patent rights. The descriptions contained herein do not imply the granting of licenses to make, use, or sell equipment constructed in accordance therewith. 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