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TEXAS INSTRUMENTS ADS7825PB

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4 Channel, 16-Bit Sampling CMOS A/D Converter, vtc marking ADS7825P

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ADS7825PB

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TEXAS INSTRUMENTS

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CONVERTERS

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477222_1.pdf

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ADS7825 ADS7825 ® ADS7825 www.burr-brown.com/databook/ADS7825.html 4 Channel, 16-Bit Sampling CMOS A/D Converter FEATURES DESCRIPTION l25μs max SAMPLING AND CONVERSION The ADS7825 can acquire and convert 16 bits to within ±2.0 LSB in 25μs max while consuming only lSINGLE +5V SUPPLY OPERATION 50mW max. Laser-trimmed scaling resistors provide lPIN-COMPATIBLE WITH 12-BIT ADS7824 the standard industrial ±10V input range and channel- lPARALLEL AND SERIAL DATA OUTPUT to-channel matching of ±0.1%. The ADS7825 is a l28-PIN 0.3" PLASTIC DIP AND SOIC low-power 16-bit sampling A/D with a four channel input multiplexer, S/H, clock, reference, and a l±2.0 LSB max INL parallel/serial microprocessor interface. It can be con- l50mW max POWER DISSIPATION figured in a continuous conversion mode to sequen- l50μW POWER DOWN MODE tially digitize all four channels. The 28-pin ADS7825 l±10V INPUT RANGE, FOUR CHANNEL is available in a plastic 0.3" DIP and in a SOIC, both MULTIPLEXER fully specified for operation over the industrial –40°C to +85°C range. lCONTINUOUS CONVERSION MODE Continuous Conversion Channel CONTC A0 A1 40kΩ R/C AIN 0 Successive Approximation Register CS Clock and Control Logic PWRD 20kΩ 8kΩ 40kΩ CDAC AIN 1 BUSY 20kΩ 8kΩ Serial DATACLK 40kΩ Data AIN Comparator 2 Out SDATA or 20kΩ 8kΩ Parallel 40kΩ Data 8 AIN 3 D7-D0 Out 20kΩ 8kΩ BYTE Internal Buffer CAP +2.5V Ref 6kΩ REF International Airport Industrial Park • Mailing Address: PO Box 11400, Tucson, AZ 85734 • Street Address: 6730 S. Tucson Blvd., Tucson, AZ 85706 • Tel: (520) 746-1111 • Twx: 910-952-1111 Internet: http://www.burr-brown.com/ • FAXLine: (800) 548-6133 (US/Canada Only) • Cable: BBRCORP • Telex: 066-6491 • FAX: (520) 889-1510 • Immediate Product Info: (800) 548-6132 ® © 1996 Burr-Brown Corporation PDS-1304B Printed in U.S.A. October, 1997 1 ADS7825 SBAS045 SPECIFICATIONS ELECTRICAL At T = –40°C to +85°C, f = 40kHz, V = V = V = +5V ±5%, using external reference, CONTC = 0V, unless otherwise specified. A S S1 S2 S ADS7825P, U ADS7825PB, UB PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS (1) RESOLUTION 16[Bits ANALOG INPUT Voltage Range ±10V[V Impedance Channel On or Off 45.7[kΩ Capacitance 35[pF THROUGHPUT SPEED Conversion Time 20[μs Acquisition Time 5[μs Multiplexer Settling Time Includes Acquisition 5[μs Complete Cycle (Acquire and Convert) 25[μs Complete Cycle (Acquire and Convert) CONTC = +5V 40[μs Throughput Rate 40[kHz DC ACCURACY (2) Integral Linearity Error ±3 ±2 LSB No Missing Codes 15 16 (3) Transition Noise 0.8[LSB (4) Full Scale Error Internal Reference ±0.5 ±0.25 % Full Scale Error Drift Internal Reference ±7 ±5 ppm/°C (4) Full Scale Error ±0.5 ±0.25 % Full Scale Error Drift ±2[ppm/°C Bipolar Zero Error ±10[mV Bipolar Zero Error Drift ±2[ppm/°C Channel-to-Channel Mismatch ±0.1 ±0.1 % Power Supply Sensitivity +4.75 < V < +5.25 ±8[LSB S AC ACCURACY (5) Spurious-Free Dynamic Range f = 1kHz 90[dB IN Total Harmonic Distortion f = 1kHz –90[dB IN Signal-to-(Noise+Distortion) f = 1kHz 83 86 dB IN Signal-to-Noise f = 1kHz 83 86 dB IN (6) Channel Separation f = 1kHz 100 120 [[ dB IN –3dB Bandwidth 2[MHz (7) Useable Bandwidth 90[kHz SAMPLING DYNAMICS Aperture Delay 40[ns (8) Transient Response FS Step 5[μs (9) Overvoltage Recovery 1[μs REFERENCE Internal Reference Voltage 2.48 2.5 2.52 [[[V Internal Reference Source Current 1[μA (Must use external buffer) External Reference Voltage Range 2.3 2.5 2.7 [[[V for Specified Linearity External Reference Current Drain V = +2.5V 100[μA REF DIGITAL INPUTS Logic Levels V –0.3 +0.8[[ V IL V +2.4 V +0.3V[[ V IH S I ±10[μA IL I ±10[μA IH DIGITAL OUTPUTS Data Format Parallel in two bytes; Serial[ Data Coding Binary Two's Complement[ V I = 1.6mA +0.4[V OL SINK V I = 500μA+4[V OH SOURCE Leakage Current High-Z State, V = 0V to V ±5[μA OUT S Output Capacitance High-Z State 15[pF The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant any BURR-BROWN product for use in life support devices and/or systems. ® ADS7825 2 SPECIFICATIONS (CONT) ELECTRICAL At T = –40°C to +85°C, f = 40kHz, V = V = V = +5V ±5%, using external reference, CONTC = 0V, unless otherwise specified. A S S1 S2 S ADS7825P, U ADS7825PB, UB PARAMETER CONDITIONS MIN TYP MAX MIN TYP MAX UNITS DIGITAL TIMING Bus Access Time PAR/SER = +5V 83[ns Bus Relinquish Time PAR/SER = +5V 83[ns Data Clock PAR/SER = 0V Internal Clock (Output only when EXT/INT LOW 0.5 1.5[[ MHz transmitting data) External Clock EXT/INT HIGH 0.1 10[[ MHz POWER SUPPLIES V = V = V +4.75 +5 +5.25 [[[V S1 S2 S Power Dissipation f = 40kHz 50[mW S PWRD HIGH 50[μW TEMPERATURE RANGE Specified Performance –40 +85[[ °C Storage –65 +150[[ °C Thermal Resistance (θ ) JA Plastic DIP 75[ °C/W SOIC 75[°C/W NOTES: (1) An asterik ([) specifies same value as grade to the left. (2) LSB means Least Significant Bit. For the 16-bit, ±10V input ADS7825, one LSB is 305μV. (3) Typical rms noise at worst case transitions and temperatures. (4) Full scale error is the worst case of –Full Scale or +Full Scale untrimmed deviation from ideal first and last code transitions, divided by the transition voltage (not divided by the full-scale range) and includes the effect of offset error. (5) All specifications in dB are referred to a full-scale ±10V input. (6) A full scale sinewave input on one channel will be attenuated by this amount on the other channels. (7) Useable Bandwidth defined as Full-Scale input frequency at which Signal-to-(Noise+Distortion) degrades to 60dB, or 10 bits of accuracy. (8) The ADS7825 will accurately acquire any input step if given a full acquisition period after the step. (9) Recovers to specified performance after 2 x FS input overvoltage, and normal acquisitions can begin. PACKAGE/ORDERING INFORMATION PACKAGE MINIMUM SIGNAL- DRAWING TEMPERATURE MAXIMUM INTEGRAL TO-(NOISE + DISTORTION) (1) PRODUCT PACKAGE NUMBER RANGE LINEARITY ERROR (LSB) RATIO (dB) ADS7825P Plastic Dip 246 –40°C to +85°C ±383 ADS7825PB Plastic Dip 246 –40°C to +85°C ±286 ADS7825U SOIC 217 –40°C to +85°C ±383 ADS7825UB SOIC 217 –40°C to +85°C ±286 NOTE: (1) For detailed drawing and dimension table, please see end of data sheet, or Appendix C of Burr-Brown IC Data Book. ABSOLUTE MAXIMUM RATINGS PIN CONFIGURATION TOP VIEW DIP/SOIC Analog Inputs: AIN , AIN , AIN , AIN .............................................. ±15V 0 1 2 3 REF ................................... (AGND2 –0.3V) to (V + 0.3V) S CAP ........................................ Indefinite Short to AGND2, AGND1 1 28 V Momentary Short to V S1 S V and V to AGND2 ........................................................................... 7V S1 S2 AIN 2 27 V 0 S2 V to V .......................................................................................... ±0.3V S1 S2 Difference between AGND1, AGND2 and DGND ............................. ±0.3V 3 26 AIN PWRD 1 Digital Inputs and Outputs .......................................... –0.3V to (V + 0.3V) S Maximum Junction Temperature ..................................................... 150°C AIN 4 25 CONTC 2 Internal Power Dissipation ............................................................. 825mW AIN 5 24 BUSY Lead Temperature (soldering, 10s) ................................................ +300°C 3 Maximum Input Current to Any Pin ................................................. 100mA CAP 6 23 CS REF 7 22 R/C ADS7825 ELECTROSTATIC 8 21 AGND2 BYTE DISCHARGE SENSITIVITY TRI-STATE D7 9 20 PAR/SER This integrated circuit can be damaged by ESD. Burr-Brown TRI-STATE D6 10 19 A0 recommends that all integrated circuits be handled with TRI-STATE D5 11 18 A1 appropriate precautions. Failure to observe proper handling D4 12 17 D0 EXT/INT TAG and installation procedures can cause damage. SYNC D3 13 16 D1 SDATA ESD damage can range from subtle performance degrada- tion to complete device failure. Precision integrated circuits DGND 14 15 D2 DATACLK may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ® 3 ADS7825 PIN ASSIGNMENTS PIN # NAME I/O DESCRIPTION 1 AGND1 Analog Ground. Used internally as ground reference point. 2 AIN Analog Input Channel 0. Full-scale input range is ±10V. 0 3 AIN Analog Input Channel 1. Full-scale input range is ±10V. 1 4 AIN Analog Input Channel 2. Full-scale input range is ±10V. 2 5 AIN Analog Input Channel 3. Full-scale input range is ±10V. 3 6 CAP Internal Reference Output Buffer. 2.2μF Tantalum to ground. 7 REF Reference Input/Output. Outputs +2.5V nominal. If used externally, must be buffered to maintain ADS7825 accuracy. Can also be driven by external system reference. In both cases, bypass to ground with a 2.2μF Tantalum capacitor. 8 AGND2 Analog Ground. 9 D7 O Parallel Data Bit 7 if PAR/SER HIGH; Tri-state if PAR/SER LOW. See Table I. 10 D6 O Parallel Data Bit 6 if PAR/SER HIGH; Tri-state if PAR/SER LOW. See Table I. 11 D5 O Parallel Data Bit 5 if PAR/SER HIGH; Tri-state if PAR/SER LOW. See Table I. 12 D4 I/O Parallel Data Bit 4 if PAR/SER HIGH; if PAR/SER LOW, a LOW level input here will transmit serial data on SDATA from the previous conversion using the internal serial clock; a HIGH input here will transmit serial data using an external serial clock input on DATACLK (D2). See Table I. 13 D3 O Parallel Data Bit 3 if PAR/SER HIGH; SYNC output if PAR/SER LOW. See Table I. 14 DGND Digital Ground. 15 D2 I/O Parallel Data Bit 2 if PAR/SER HIGH; if PAR/SER LOW, this will output the internal serial clock if EXT/INT (D4) is LOW; will be an input for an external serial clock if EXT/INT (D4) is HIGH. See Table I. 16 D1 O Parallel Data Bit 1 if PAR/SER HIGH; SDATA serial data output if PAR/SER LOW. See Table I. 17 D0 I/O Parallel Data Bit 0 if PAR/SER HIGH; TAG data input if PAR/SER LOW. See Table I. 18 A1 I/O Channel Address. Input if CONTC LOW, output if CONTC HIGH. See Table I. 19 A0 I/O Channel Address. Input if CONTC LOW, output if CONTC HIGH. See Table I. 20 PAR/SER I Select Parallel or Serial Output. If HIGH, parallel data will be output on D0 thru D7. If LOW, serial data will be output on SDATA. See Table I and Figure 1. 21 BYTE I Byte Select. Only used with parallel data, when PAR/SER HIGH. Determines which byte is available on D0 thru D7. Changing BYTE with CS LOW and R/C HIGH will cause the data bus to change accordingly. LOW selects the 8 MSBs; HIGH selects the 8 LSBs. See Figures 2 and 3 22 R/C I Read/Convert Input. With CS LOW, a falling edge on R/C puts the internal sample/hold into the hold state and starts a conversion. With CS LOW, a rising edge on R/C enables the output data bits if PAR/SER HIGH, or starts transmission of serial data if PAR/SER LOW and EXT/INT HIGH. 23 CS I Chip Select. Internally OR'd with R/C. With CONTC LOW and R/C LOW, a falling edge on CS will initiate a conversion. With R/C HIGH, a falling edge on CS will enable the output data bits if PAR/SER HIGH, or starts transmission of serial data if PAR/SER LOW and EXT/INT HIGH. 24 BUSY O Busy Output. Falls when conversion is started; remains LOW until the conversion is completed and the data is latched into the output register. In parallel output mode, output data will be valid when BUSY rises, so that the rising edge can be used to latch the data. 25 CONTC I Continuous Conversion Input. If LOW, conversions will occur normally when initiated using CS and R/C; if HIGH, acquisition and conversions will take place continually, cycling through all four input channels, as long as CS, R/C and PWRD are LOW. See Table I. For serial mode only. 26 PWRD I Power Down Input. If HIGH, conversions are inhibited and power consumption is significantly reduced. Results from the previous conversion are maintained in the output register. In the continuous conversion mode, the multiplexer address channel is reset to channel 0. 27 V Supply Input. Nominally +5V. Connect directly to pin 28. Decouple to ground with 0.1μF ceramic and 10μF Tantalum S2 capacitors. 28 V Supply Input. Nominally +5V. Connect directly to pin 27. S1 ® ADS7825 4 TYPICAL PERFORMANCE CURVES At T = +25°C, f = 40kHz, V = V = +5V, using internal reference, unless otherwise noted. A S S1 S2 FREQUENCY SPECTRUM CROSSTALK vs INPUT FREQUENCY (8192 Point FFT; f = 1.02kHz, –0.5dB) (Active Channel Amplitude = –0.1dB) IN 0 –60.0 –10 –70.0 –20 Adjacent Channels, Worst Pair –30 –80.0 –40 –90.0 –50 Adjacent Channels –60 –100.0 –70 Non-Adjacent Channels –80 –110.0 –90 –120.0 –100 Measurement Limit –110 –130.0 –120 –130 –140.0 0 5 10 15 20 100 1k 10k 100k Frequency (kHz) Active Channel Input Frequency (Hz) ADJACENT CHANNEL CROSSTALK, WORST PAIR ADJACENT CHANNEL CROSSTALK, WORST PAIR (8192 Point FFT; AIN = 1.02kHz, –0.1dB; AIN = AGND) (8192 Point FFT; AIN = 10.1kHz, –0.1dB; AIN = AGND ) 3 2 3 2 0 0 –10 –10 –20 –20 –30 –30 –40 –40 –50 –50 –60 –60 –70 –70 –80 –80 –90 –90 –100 –100 –110 –110 –120 –120 –130 –130 0 5 10 15 20 0 5 10 15 20 Frequency (kHz) Frequency (kHz) SIGNAL-TO-(NOISE + DISTORTION) SIGNAL-TO-(NOISE + DISTORTION) vs INPUT FREQUENCY AND INPUT AMPLITUDE vs INPUT FREQUENCY (f = –0.1dB) IN 100 100 90 90 0dB 80 80 –20dB 70 70 60 50 60 40 50 –60dB 30 40 20 30 10 0 2 4 6 8 10 12 14 16 18 20 100 1k 10k 100k Input Signal Frequency (Hz) Input Signal Frequency (kHz) ® 5 ADS7825 Amplitude (dB) Amplitude (dB) SINAD (dB) Resulting Amplitude on Selected Channel (dB) (Input Grounded) Amplitude (dB) SINAD (dB) TYPICAL PERFORMANCE CURVES (CONT) At T = +25°C, f = 40kHz, V = V = +5V, using internal reference, unless otherwise noted. A S S1 S2 A. C. PARAMETERS vs TEMPERATURE (f = 1kHz, –0.1dB) IN 110 –110 3 2 All Codes INL 1 105 –105 SFDR 0 –1 100 –100 –2 –3 0 8192 16384 24576 32768 40960 49152 57344 65535 95 –95 Decimal Code SNR THD 90 –90 3 2 All Codes DNL 85 –85 SINAD 1 0 80 –80 –1 –50 –25 0 25 50 75 100 –2 Temperature (°C) –3 0 8192 16384 24576 32768 40960 49152 57344 65535 Decimal Code ENDPOINT ERRORS 2 POWER SUPPLY RIPPLE SENSITIVITY BPZ Error INL/DNL DEGRADATION PER LSB OF P-P RIPPLE 1 1 0 –1 –1 10 –2 0.2 –2 10 INL +FS Error –3 0 10 –4 –0.2 10 DNL 0.2 –5 –FS Error 10 1 2 3 4 5 6 7 10 10 10 10 10 10 10 0 Power Supply Ripple Frequency (Hz) –0.2 –50 –25 0 25 50 75 100 Temperature (°C) INTERNAL REFERENCE VOLTAGE CONVERSION TIME vs TEMPERATURE vs TEMPERATURE 20.4 2.520 2.515 20.2 2.510 2.505 20 2.500 2.495 19.8 2.490 2.485 19.6 2.480 –50 –25 0 25 50 75 100 –50 –25 0 25 50 75 100 Temperature (°C) Temperature (°C) ® ADS7825 6 Internal Reference (V) Linearity Degradation (LSB/LSB) SFDR, SINARD, and SNR (dB) THD (dB) Percent Percent Conversion Time (µs) From Ideal From Ideal mV From Ideal 16-Bit LSBs 16-Bit LSBs BASIC OPERATION SERIAL OUTPUT PARALLEL OUTPUT Figure 1b shows a basic circuit to operate the ADS7825 with Figure 1a shows a basic circuit to operate the ADS7825 with serial output (Channel 0 selected). Taking R/C (pin 22) parallel output (Channel 0 selected). Taking R/C (pin 22) LOW for 40ns (12μs max) will initiate a conversion and LOW for 40ns (12μs max) will initiate a conversion. BUSY output valid data from the previous conversion on SDATA (pin 24) will go LOW and stay LOW until the conversion is (pin 16) synchronized to 16 clock pulses output on completed and the output register is updated. If BYTE (pin DATACLK (pin 15). BUSY (pin 24) will go LOW and stay 21) is LOW, the 8 most significant bits will be valid when LOW until the conversion is completed and the serial data pin 24 rises; if BYTE is HIGH, the 8 least significant bits has been transmitted. Data will be output in Binary Two’s will be valid when BUSY rises. Data will be output in Binary Two’s Complement format. BUSY going HIGH can Complement format, MSB first, and will be valid on both the rising and falling edges of the data clock. BUSY going be used to latch the data. After the first byte has been read, HIGH can be used to latch the data. All convert commands BYTE can be toggled allowing the remaining byte to be will be ignored while BUSY is LOW. read. All convert commands will be ignored while BUSY is LOW. The ADS7825 will begin tracking the input signal at the end The ADS7825 will begin tracking the input signal at the end of the conversion. Allowing 25μs between convert com- mands assures accurate acquisition of a new signal. of the conversion. Allowing 25μs between convert com- mands assures accurate acquisition of a new signal. Parallel Output (a) 1 28 0.1µF 10µF ±10V 2 27 +5V + + 3 26 4 25 BUSY 5 24 Convert Pulse + 6 23 R/C 2.2µF + 7 22 ADS7825 2.2µF BYTE 8 21 40ns min (1) +5V 9 20 10 19 11 18 12 17 13 16 14 15 (b) Serial Output Pin 21 D15 D14 D13 D12 D11 D10 D9 D8 LOW Pin 21 D7 D6 D5 D4 D3 D2 D1 D0 1 28 HIGH 0.1µF 10µF NOTE: (1) PAR/SER = 5V ±10V 2 27 +5V + + 3 26 4 25 BUSY 5 24 Convert Pulse + 6 23 2.2µF R/C + 7 22 ADS7825 2.2µF 8 21 40ns min (3) (2) NC 9 20 (2) 10 19 NC (2) NC 11 18 EXT/INT 12 17 SYNC SDATA 13 16 (1) 14 15 DATACLK NOTES: (1) DATACLK (pin 15) is an output when EXT/INT (pin 12) is LOW and an input when EXT/INT is HIGH. (2) NC = no connection. (3) PAR/SER = 0V. FIGURE 1. Basic Connection Diagram, (a) Parallel Output, (b) Serial Output. ® 7 ADS7825 STARTING A CONVERSION The combination of CS (pin 23) and R/C (pin 22) LOW for initiating a conversion. If, however, it is critical that CS or a minimum of 40ns places the sample/hold of the ADS7825 R/C initiates conversion ‘n’, be sure the less critical input is in the hold state and starts conversion ‘n’. BUSY (pin 24) LOW at least 10ns prior to the initiating input. If EXT/INT will go LOW and stay LOW until conversion ‘n’ is com- (pin 12) is LOW when initiating conversion ‘n’, serial data pleted and the internal output register has been updated. All from conversion ‘n – 1’ will be output on SDATA (pin 16) new convert commands during BUSY LOW will be ignored. following the start of conversion ‘n’. See Internal Data CS and/or R/C must go HIGH before BUSY goes HIGH or Clock in the Reading Data section. a new conversion will be initiated without sufficient time to To reduce the number of control pins, CS can be tied LOW acquire a new signal. using R/C to control the read and convert modes. This will The ADS7825 will begin tracking the input signal at the end have no effect when using the internal data clock in the serial of the conversion. Allowing 25μs between convert com- output mode. However, the parallel output and the serial mands assures accurate acquisition of a new signal. Refer to output (only when using an external data clock) will be Tables Ia and Ib for a summary of CS, R/C, and BUSY states affected whenever R/C goes HIGH. Refer to the Reading and Figures 2 through 6 and Table II for timing information. Data section and Figures 2, 3, 5, and 6. CS and R/C are internally OR’d and level triggered. There is not a requirement which input goes LOW first when INPUTS OUTPUTS CS R/C BYTE CONTC PWRD BUSY D7 D6 D5 D4 D3 D2 D1 D0 COMMENTS 1 X X X X X Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z X 0 X X X X Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z 0 1 0 X X X D15 D14 D13 D12 D11 D10 D9 D8 Results from last (MSB) completed conversion. 0 1 1 X X X D7 D6 D5 D4 D3 D2 D1 D0 Results from last (LSB) completed conversion. 01 XX X ↑ ↑↓ ↑↓ ↑↓↑↓↑↓ ↑↓↑↓↑↓ Data will change at the end of a conversion. TABLE Ia. Read Control for Parallel Data (PAR/SER = 5V.) D4 D3 D2 D1 D0 CS R/C CONTC PWRD BUSY D7, D6, D5 EXT/INT SYNC DATACLK SDATA TAG Input Input Input Input Output Output Input Output I/O Output Input COMMENTS 1 X X X 1 Hi-Z LOW LOW Output Hi-Z X X 0 X X 1 Hi-Z LOW LOW Output Hi-Z X 0 ↓ 0 X 1 HI-Z LOW LOW Output Output X Starts transmission of data from previous conversion on SDATA synchronized to 16 pulses output on DATACLK. ↓ 0 0 X 1 Hi-Z LOW LOW Output Output X Starts transmission of data from previous conversion on SDATA synchronized to 16 pulses output on DATACLK. 0 1 0 X X Hi-Z HIGH LOW Input Output Input The level output on SDATA will be the level input on TAG 16 DATACLK input cycles. 0 10X ↑ Hi-Z HIGH LOW Input Output Input At the end of the conversion, when BUSY rises, data from the conversion will be shifted into the output registers. If DATACLK is HIGH, valid data will be lost. 0 ↑ 0 X 1 Hi-Z HIGH LOW Input Output X Initiates transmission of a HIGH pulse on SYNC followed by data from last completed conversion on SDATA synchronized to the input on DATACLK. ↓ 1 0 X 1 Hi-Z HIGH LOW Input Output X Initiates transmission of a HIGH pulse on SYNC followed by data from last completed conversion on SDATA synchronized to the input on DATACLK. 00 1 0 ↓ Hi-Z LOW LOW Output Output X Starts transmission of data from previous conversion on SDATA synchronized to 16 pulses output on DATACLK ↓ 1 X X X Hi-Z HIGH Output Input Output X SDATA becomes active. Inputs on DATACLK shift out data. 0 ↑ X X X Hi-Z HIGH Output Input Output X SDATA becomes active. Inputs on DATACLK shift out data. ↓ 0 1 X X Hi-Z LOW LOW Output Output X Restarts continuous conversion mode (n – 1 data transmitted when BUSY is LOW). 0 ↓ 1 X X Hi-Z LOW LOW Output Output X Restarts continuous conversion mode (n – 1 data transmitted when BUSY is LOW). TABLE Ib. Read Control for Serial Data (PAR/SER = 0V.) ® ADS7825 8 t t 1 1 R/C t t 3 3 t 4 t BUSY 5 t t 6 6 t t 7 8 MODE Acquire Convert Acquire Convert t t 12 12 t 11 t 10 Parallel Previous Previous High Previous Low High Byte Low Byte High Byte Hi-Z Not Valid Hi-Z Data Bus High Byte Valid Byte Valid Byte Valid Valid Valid Valid t t 2 9 t t t t t 12 12 9 12 12 BYTE FIGURE 2. Conversion Timing with Parallel Output (CS LOW). t t t t t t 21 21 21 21 21 21 R/C t 1 CS t 3 t 4 BUSY t t t t 21 21 21 21 BYTE DATA Hi-Z State High Byte Hi-Z State Low Byte Hi-Z State BUS t t t t 12 9 12 9 FIGURE 3. Using CS to Control Conversion and Read Timing with Parallel Outputs. t + t 7 8 (1) CS or R/C t 14 1 2 3 15 16 1 2 t 13 DATACLK t 16 t 15 SDATA MSB Valid Bit 14 Valid Bit 13 Valid Bit 1 Valid LSB Valid MSB Valid Bit 14 Valid Hi-Z Hi-Z t 25 (Results from previous conversion.) BUSY t 26 NOTE: (1) If controlling with CS, tie R/C LOW. If controlling with R/C, tie CS LOW. FIGURE 4. Serial Data Timing Using Internal Data Clock (TAG LOW). ® 9 ADS7825 ® ADS7825 10 t 17 t t 18 19 0 12 34 17 18 EXTERNAL DATACLK t t 22 1 t 20 CS t 21 R/C t t 3 21 BUSY t 23 SYNC t 17 t 24 Bit 15 (MSB) Bit 14 Bit 1 Bit 0 (LSB) Tag 0 SDATA t t 28 27 Tag 0 Tag 1 Tag 2 Tag 15 Tag 16 Tag 17 TAG FIGURE 5. Conversion and Read Timing with External Clock (EXT/INT HIGH). Read After Conversion. ® 11 ADS7825 t 17 t t 18 19 EXTERNAL DATACLK t 22 CS t 21 t 20 R/C t 1 t 11 BUSY t t 23 3 SYNC t 17 SDATA Bit 15 (MSB) Bit 0 (LSB) Tag 0 t t t 27 24 28 Tag 0 Tag 1 Tag 16 Tag 17 TAG FIGURE 6. Conversion and Read Timing with External Clock (EXT/INT HIGH). Read During Conversion (Previous Conversion Results). after the start of conversion ‘n’. Do not attempt to read data READING DATA beyond 12μs after the start of conversion ‘n’ until BUSY PARALLEL OUTPUT (pin 24) goes HIGH; this may result in reading invalid data. To use the parallel output, tie PAR/SER (pin 20) HIGH. The Refer to Table II and Figures 2 and 3 for timing constraints. parallel output will be active when R/C (pin 22) is HIGH and CS (pin 23) is LOW. Any other combination of CS and R/C SERIAL OUTPUT will tri-state the parallel output. Valid conversion data can be When PAR/SER (pin 20) is LOW, data can be clocked out read in two 8-bit bytes on D7-D0 (pins 9-13 and 15-17). When serially with the internal data clock or an external data clock. BYTE (pin 21) is LOW, the 8 most significant bits will be When EXT/INT (pin 12) is LOW, DATACLK (pin 15) is an valid with the MSB on D7. When BYTE is HIGH, the 8 least output and is always active regardless of the state of CS (pin significant bits will be valid with the LSB on D0. BYTE can 23) and R/C (pin 22). The SDATA output is active when be toggled to read both bytes within one conversion cycle. BUSY (pin 24) is LOW. Otherwise, it is in a tri-state Upon initial power up, the parallel output will contain condition. When EXT/INT is HIGH, DATACLK is an input. indeterminate data. The SDATA output is active when CS is LOW and R/C is HIGH. Otherwise, it is in a tri-state condition. Regardless of PARALLEL OUTPUT (After a Conversion) the state of EXT/INT, SYNC (pin 13) is an output and always active, while TAG (pin 17) is always an input. After conversion ‘n’ is completed and the output registers have been updated, BUSY (pin 24) will go HIGH. Valid data from conversion ‘n’ will be available on D7-D0 (pins 9-13 INTERNAL DATA CLOCK (During A Conversion) and 15-17). BUSY going HIGH can be used to latch the To use the internal data clock, tie EXT/INT (pin 12) LOW. data. Refer to Table II and Figures 2 and 3 for timing The combination of R/C (pin 22) and CS (pin 23) LOW will constraints. initiate conversion ‘n’ and activate the internal data clock (typically 900kHz clock rate). The ADS7825 will output 16 PARALLEL OUTPUT (During a Conversion) bits of valid data, MSB first, from conversion ‘n – 1’ on SDATA (pin 16), synchronized to 16 clock pulses output on After conversion ‘n’ has been initiated, valid data from conversion ‘n – 1’ can be read and will be valid up to 12μs SYMBOL DESCRIPTION MIN TYP MAX UNITS t Convert Pulse Width 0.04 12 μs 1 t Start of Conversion to New Data Valid 20 21 μs 2 Start of Conversion to BUSY LOW 85 ns t 3 t BUSY LOW 20 21 μs 4 t End of Conversion to BUSY HIGH 90 ns 5 t Aperture Delay 40 ns 6 t Conversion Time 20 21 μs 7 t Acquisition Time 45 μs 8 t + t Throughput Time 25 μs 7 8 t Bus Relinquish Time 10 83 ns 9 t Data Valid to BUSY HIGH 20 60 ns 10 t Start of Conversion to Previous Data Not Valid 12 20 μs 11 t Bus Access Time and BYTE Delay 83 ns 12 t Start of Conversion to DATACLK Delay 1.4 μs 13 t DATACLK Period 1.1 μs 14 t Data Valid to DATACLK HIGH 20 75 ns 15 t DATACLK LOW to Data Not Valid 400 600 ns 16 t External DATACLK Period 100 ns 17 t External DATACLK HIGH 50 ns 18 t External DATACLK LOW 40 ns 19 t CS LOW and R/C HIGH to External DATACLK HIGH (Enable Clock) 25 ns 20 t R/C to CS Setup Time 10 ns 21 t CS HIGH or R/C LOW to External DATACLK HIGH (Disable Clock) 25 ns 22 t DATACLK HIGH to SYNC HIGH 15 35 ns 23 t DATACLK HIGH to Valid Data 25 55 ns 24 t Start of Conversion to SDATA Active 83 ns 25 t End of Conversion to SDATA Tri-State 83 ns 26 t CS LOW and R/C HIGH to SDATA Active 83 ns 27 t CS HIGH or R/C LOW to SDATA Tri-State 83 ns 28 t BUSY HIGH to Address Valid 20 ns 29 t Address Valid to BUSY LOW 500 ns 30 TABLE II. Conversion, Data, and Address Timing. T = –40°C to +85°C. A ® ADS7825 12 DATACLK (pin 15). The data will be valid on both the The first bit input on TAG will be valid on SDATA on the rising and falling edges of the internal data clock. The rising 18th falling edge and the 19th rising edge of DATACLK; the edge of BUSY (pin 24) can be used to latch the data. After second input bit will be valid on the 19th falling edge and the the 16th clock pulse, DATACLK will remain LOW until the 20th rising edge, etc. With a continuous data clock, TAG next conversion is initiated, while SDATA will go to what- data will be output on DATA until the internal output ever logic level was input on TAG (pin 17) during the first registers are updated with the results from the next conver- clock pulse. The SDATA output will tri-state when BUSY sion. Refer to Table II and Figure 5 for timing information. returns HIGH. Refer to Table II and Figure 4 for timing information. EXTERNAL DATA CLOCK (During a Conversion) After conversion ‘n’ has been initiated, valid data from EXTERNAL DATA CLOCK conversion ’n-1’ can be read and will be valid up to 12μs To use an external clock, tie EXT/INT (pin 12) HIGH. The after the start of conversion ‘n’. Do not attempt to clock out external clock is not a conversion clock; it can only be used data from 12μs after the start of conversion ‘n’ until BUSY as a data clock. To enable the output mode of the ADS7825, (pin 24) rises; this will result in data loss. CS (pin 23) must be LOW and R/C (pin 22) must be HIGH. NOTE: For the best possible performance when using an DATACLK must be HIGH for 20% to 70% of the total data external data clock, data should not be clocked out during a clock period; the clock rate can be between DC and 10MHz. conversion. The switching noise of the asynchronous data clock Serial data from conversion ‘n’ can be output on SDATA can cause digital feedthrough degrading the converter’s perfor- (pin 16) after conversion ‘n’ is completed or during conver- mance. Refer to Table II and Figure 6 for timing information. sion ‘n + 1’. An obvious way to simplify control of the converter is to tie TAG FEATURE CS LOW while using R/C to initiate conversions. While this TAG (pin 17) inputs serial data synchronized to the external is perfectly acceptable, there is a possible problem when or internal data clock. using an external data clock. At an indeterminate point from When using an external data clock, the serial bit stream input 12μs after the start of conversion ‘n’ until BUSY rises, the on TAG will follow the LSB output on SDATA (pin 16) internal logic will shift the results of conversion ‘n’ into the until the internal output register is updated with new conver- output register. If CS is LOW, R/C is HIGH and the external sion results. See Table II and Figures 5 and 6. clock is HIGH at this point, data will be lost. So, with CS LOW, either R/C and/or DATACLK must be LOW during The logic level input on TAG for the first rising edge of the this period to avoid losing valid data. internal data clock will be valid on SDATA after all 16 bits of valid data have been output. EXTERNAL DATA CLOCK (After a Conversion) MULTIPLEXER TIMING After conversion ‘n’ is completed and the output registers have been updated, BUSY (pin 24) will go HIGH. With CS The four channel input multiplexer may be addressed manu- LOW (pin 23) and R/C HIGH (pin 22), valid data from ally or placed in a continuous conversion mode where all conversion ‘n’ will be output on SDATA (pin 16) synchro- four channels are sequentially addressed. nized to the external data clock input on DATACLK (pin 15). Between 15 and 35ns following the rising edge of the CONTINUOUS CONVERSION MODE (CONTC = 5V) first external data clock, the SYNC output pin will go HIGH To place the ADS7825 in the continuous conversion mode, for one full data clock period (100ns minimum). The MSB CONTC (pin 25) must be tied HIGH. In this mode, acquisi- will be valid between 25 and 55ns after the rising edge of the tion and conversions will take place continually, cycling second data clock. The LSB will be valid on the 17th falling through all four channels as long as CS, R/C and PWRD are edge and the 18th rising edge of the data clock. TAG (pin LOW (See Table III). Whichever address was last loaded 17) will input a bit of data for every external clock pulse. CONTC CS R/C BUSY PWRD A0 and A1 OPERATION 0 X X X X Inputs Initiating conversion n latches in the levels input on A0 and A1 to select the channel for conversion 'n + 1'. 0 X X 0 0 Inputs Conversion in process. New convert commands ignored. 00 ↓ 1 0 Inputs Initiates conversion on channel selected at start of previous conversion. 0 ↓ 0 1 0 Inputs Initiates conversion on channel selected at start of previous conversion. 0 X X X 1 Inputs All analog functions powered down. Conversions in process or initiated will yield meaningless data. 1 X X X X Outputs The end of conversion 'n' (when BUSY rises) increments the internal channel latches and outputs the channel address for conversion 'n + 1' on A0 and A1. 1 X X 0 0 Outputs Conversion in process. 10 ↓ 1 0 Outputs Restarts continuous conversion process on next input channel. 1 ↓ 0 1 0 Outputs Restarts continuous conversion process on next input channel. 1 X X X 1 Outputs All analog functions powered down. Conversions in process or initiated will yield meaningless data. Resets selected input channel for next conversion to AIN . 0 TABLE III. Conversion Control. ® 13 ADS7825 into the A0 and A1 registers (pins 19 and 18, respectively) conversions will proceed through each higher channel, cy- prior to CONTC being raised HIGH, becomes the first cling back to zero after Channel 3. address in the sequential continuous conversion mode (e.g., If PWRD is held HIGH for a significant period of time, the if Channel 1 was the last address selected then Channel 2 REF (pin 7) bypass capacitor may discharge (if the internal will follow, then Channel 3, and so on). The A0 and A1 reference is being utilized) and the CAP (pin 6) bypass address inputs become outputs when the device is in this capacitor will discharge (for both internal and external mode. When BUSY rises at the end of a conversion, A0 and references). The continuous conversion mode should not be A1 will output the address of the channel that will be enabled until the bypass capacitor(s) have recharged and converted when BUSY goes LOW at the beginning of the stabilized (1ms for 2.2μF capacitors recommended). In next conversion. Data will be valid for the previous channel addition, the continuous conversion mode should not be when BUSY rises. See Table IVa and Figure 7 for channel enabled even with a short pulse on PWRD until the mini- selection timing in continuous conversion mode. mum acquisition time has been met. PWRD (pin 26) can be used to reset the multiplexer address to zero. With the ADS7825 configured for no conversion, MANUAL CHANNEL SELECTION (CONTC= 0V) PWRD can be taken HIGH for a minimum of 200ns. When The channels of the ADS7825 can be selected manually by PWRD returns LOW, the multiplexer address will be reset using the A0 and A1 address pins (pins 19 and 18, respec- to zero. When the continuous conversion mode is enabled, tively). See Table IVb for the multiplexer truth table and the first conversion will be done on channel 0. Subsequent Figure 8 for channel selection timing. ADS7825 TIMING AND CONTROL DATA AVAILABLE CHANNEL TO BE OR A1 A0 FROM CHANNEL BEING CONVERTED DESCRIPTION OF OPERATION 0 0 AIN AIN 3 0 Channel being acquired or converted is output on these 0 1 AIN AIN 0 1 address lines. Data is valid for the previous channel. These 1 0 AIN AIN 1 2 lines are updated when BUSY rises. 1 1 AIN AIN 2 3 TABLE IVa. A0 and A1 Outputs (CONTC HIGH). CHANNEL SELECTED A1 A0 WHEN BUSY GOES HIGH DESCRIPTION OF OPERATION 0 0 AIN Channel to be converted during conversion 'n + 1' is latched 0 0 1 AIN when conversion 'n' is initiated (BUSY goes LOW). The selected 1 1 0 AIN input starts being acquired as soon as conversion 'n' is done 2 1 1 AIN (BUSY goes HIGH). 3 TABLE IVb. A0 and A1 Inputs (CONTC LOW). Conversion Currently in Progress: n – 2 n – 1 n n + 1 n + 2 n + 3 n + 4 BUSY Channel Address for Conversion: A0, A1 n – 2 n – 1 n n + 1 n + 2 n + 3 n + 4 n + 5 (Output) t 29 Results from Conversion: D7-D0 n – 3 n – 2 n – 1 n n + 1 n + 2 n + 3 n + 4 FIGURE 7. Channel Addressing in Continuous Conversion Mode (CONTC HIGH, CS and R/C LOW). R/C Conversion Currently in Progress: n – 2 n – 1 n n + 1 n + 2 n + 3 n + 4 BUSY Channel Address for Conversion: A0, A1 n – 1 n n + 1 n + 2 n + 3 n + 4 n + 5 (Input) t 30 Results from Conversion: D7-D0 n – 3 n – 2 n – 1 n n + 1 n + 2 n + 3 n + 4 FIGURE 8. Channel Addressing in Normal Conversion Mode (CONTC and CS LOW). ® ADS7825 14 CDAC. Capacitor values larger than 2.2μF will have little CALIBRATION affect on improving performance. The ADS7825 has no internal provision for correcting the individual bipolar zero error or full-scale error for each The output of the buffer is capable of driving up to 1mA of current to a DC load. Using an external buffer will allow the individual channel. Instead, the bipolar zero error of each channel is guaranteed to be below a level which is quite internal reference to be used for larger DC loads and AC small for a 16-bit converter with a ±10V input range (slightly loads. Do not attempt to directly drive an AC load with the output voltage on CAP. This will cause performance degra- more than ±32 LSBs). In addition, the channel errors should match each other to within 16 LSBs. dation of the converter. For the full-scale error, the circuit of Figure 9 can be used. PWRD This will allow the reference to be adjusted such that the full-scale error for any single channel can be set to zero. PWRD (pin 26) HIGH will power down all of the analog Again, the close matching of the channels will ensure that circuitry including the reference. Data from the previous the full-scale errors on the other channels will be small. conversion will be maintained in the internal registers and can still be read. With PWRD HIGH, a convert command yields meaningless data. When PWRD is returned LOW, AIN adequate time must be provided in order for the capacitors 2 on REF (pin 7) and CAP (pin 6) to recharge. For 2.2μF capacitors, a minimum recharge/settling time of 1ms is AIN 3 recommended before the conversion results should be con- sidered valid. CAP +5V + R 1 2.2µF 1MΩ P REF 1 LAYOUT + 50kΩ 2.2µF POWER AGND2 The ADS7825 uses 90% of its power for the analog cir- cuitry, and the converter should be considered an analog component. For optimum performance, tie both power pins FIGURE 9. Full Scale Trim. to the same +5V power supply and tie the analog and digital grounds together. REFERENCE The +5V power for the converter should be separate from the +5V used for the system’s digital logic. Connecting V S1 The ADS7825 can operate with its internal 2.5V reference or and V (pins 28 and 27) directly to a digital supply can S2 an external reference. By applying an external reference to reduce converter performance due to switching noise from pin 7, the internal reference can be bypassed. the digital logic. For best performance, the +5V supply can be produced from whatever analog supply is used for the rest REF of the analog signal conditioning. If +12V or +15V supplies REF (pin 7) is an input for an external reference or the output are present, a simple +5V regulator can be used. Although it for the internal 2.5V reference. A 2.2μF capacitor should be is not suggested, if the digital supply must be used to power connected as close to the REF pin as possible. This capacitor the converter, be sure to properly filter the supply. Either and the output resistance of REF create a low pass filter to using a filtered digital supply or a regulated analog supply, bandlimit noise on the reference. Using a smaller value both V and V should be tied to the same +5V source. S1 S2 capacitor will introduce more noise to the reference degrad- ing the SNR and SINAD. The REF pin should not be used GROUNDING to drive external AC or DC loads. Three ground pins are present on the ADS7825. DGND is The range for the external reference is 2.3V to 2.7V and the digital supply ground. AGND2 is the analog supply determines the actual LSB size. Increasing the reference ground. AGND1 is the ground which all analog signals voltage will increase the full scale range and the LSB size of internal to the A/D are referenced. AGND1 is more suscep- the converter which can improve the SNR. tible to current induced voltage drops and must have the path of least resistance back to the power supply. CAP All the ground pins of the A/D should be tied to an analog ground plane, separated from the system’s digital logic CAP (pin 6) is the output of the internal reference buffer. A ground, to achieve optimum performance. Both analog and 2.2μF capacitor should be placed as close to the CAP pin as digital ground planes should be tied to the ‘system’ ground possible to provide optimum switching currents for the as near to the power supplies as possible. This helps to CDAC throughout the conversion cycle. This capacitor also prevent dynamic digital ground currents from modulating provides compensation for the output of the buffer. Using a the analog ground through a common impedance to power capacitor any smaller than 1μF can cause the output buffer ground. to oscillate and may not have sufficient charge for the ® 15 ADS7825 CROSSTALK SIGNAL CONDITIONING The FET switches used for the sample hold on many CMOS The worst-case channel-to-channel crosstalk versus input frequency is shown in the Typical Performance Curves A/D converters release a significant amount of charge injec- section of this data sheet. With a full-scale 1kHz input tion which can cause the driving op amp to oscillate. The signal, worst case crosstalk on the ADS7825 is better than amount of charge injection due to the sampling FET switch –115dB. This should be adequate for even the most de- on the ADS7825 is approximately 5-10% of the amount on similar ADCs with the charge redistribution DAC (CDAC) manding applications. However, if crosstalk is a concern, the following items should be kept in mind: The worst case architecture. There is also a resistive front end which attenu- ates any charge which is released. The end result is a crosstalk is generally from channel 3 to 2. In addition, crosstalk from Channel 3 to any other channel is worse than minimal requirement for the drive capability on the signal from those channels to Channel 3. The reason for this is that conditioning preceding the A/D. Any op amp sufficient for the signal in an application will be sufficient to drive the Channel 3 is nearer to the reference on the ADS7825. This allows two coupling modes: channel-to-channel and Chan- ADS7825. nel 3 to the reference. In general, when crosstalk is a The resistive front end of the ADS7825 also provides a concern, avoid placing signals with higher frequency com- guaranteed ±15V overvoltage protection. In most cases, this ponents on Channel 3. eliminates the need for external overvoltage protection The worst case crosstalk occurs from Channel 3 to Channel circuitry. 2 as shown in the Crosstalk vs Input Frequency graph in the Typical Performance Curves section. Other adjacent chan- INTERMEDIATE LATCHES nels are typically several dB better than this while non- The ADS7825 does have tri-state outputs for the parallel adjacent channels are typically 10dB better. If a particular port, but intermediate latches should be used if the bus will channel should be as immune as possible from crosstalk, be active during conversions. If the bus is not active during channel 0 would be the best channel for the signal and conversions, the tri-state outputs can be used to isolate the channel 1 should have the signal with the lowest frequency A/D from other peripherals on the same bus. content. If two signals are to have as little crosstalk as Intermediate latches are beneficial on any monolithic A/D possible, they should be placed on Channel 0 and Channel converter. The ADS7825 has an internal LSB size of 38μV. 2 with lower frequency, less-sensitive inputs on the other Transients from fast switching signals on the parallel port, channels. even when the A/D is tri-stated, can be coupled through the If crosstalk is a concern for all channels, keep in mind that the substrate to the analog circuitry causing degradation of crosstalk graph shows crosstalk between any two channels. converter performance. Total crosstalk to any given channel is the sum of the For an ADS7825 with proper layout, grounding, and bypass- crosstalk contributions from all the other channels. Since non- ing, the effect can be a few LSBs of error. In some cases, this adjacent channels contribute very little, their contribution can error can be treated as an increase in converter noise and generally be ignored. A good approximation for absolute simply averaged out. In others, the error may not be random worst case crosstalk would be to add 6dB to the highest curve and will produce an error in the conversion result, even with shown in the Crosstalk vs Input Frequency graph. averaging. Poor grounding, poor bypassing, and high-speed digital signals will increase the magnitude of the errors— possibly to many tens of LSBs. ® ADS7825 16 PACKAGE OPTION ADDENDUM www.ti.com 3-Oct-2003 PACKAGING INFORMATION ORDERABLE DEVICE STATUS(1) PACKAGE TYPE PACKAGE DRAWING PINS PACKAGE QTY ADS7825P ACTIVE PDIP NT 28 13 ADS7825PB ACTIVE PDIP NT 28 13 ADS7825U ACTIVE SOIC DW 28 28 ADS7825U/1K ACTIVE SOIC DW 28 1000 ADS7825UB ACTIVE SOIC DW 28 28 ADS7825UB/1K ACTIVE SOIC DW 28 1000 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where mandated by government requirements, testing of all parameters of each product is not necessarily performed. TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and applications using TI components. To minimize the risks associated with customer products and applications, customers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright, mask work right, or other TI intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information published by TI regarding third-party products or services does not constitute a license from TI to use such products or services or a warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. Reproduction of information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. Reproduction of this information with alteration is an unfair and deceptive business practice. TI is not responsible or liable for such altered documentation. Resale of TI products or services with statements different from or beyond the parameters stated by TI for that product or service voids all express and any implied warranties for the associated TI product or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. Following are URLs where you can obtain information on other Texas Instruments products and application solutions: Products Applications Amplifiers amplifier.ti.com Audio www.ti.com/audio Data Converters dataconverter.ti.com Automotive www.ti.com/automotive DSP dsp.ti.com Broadband www.ti.com/broadband Interface interface.ti.com Digital Control www.ti.com/digitalcontrol Logic logic.ti.com Military www.ti.com/military Power Mgmt power.ti.com Optical Networking www.ti.com/opticalnetwork Microcontrollers microcontroller.ti.com Security www.ti.com/security Telephony www.ti.com/telephony Video & Imaging www.ti.com/video Wireless www.ti.com/wireless Mailing Address: Texas Instruments Post Office Box 655303 Dallas, Texas 75265 Copyright  2003, Texas Instruments Incorporated

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