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Part Number Description Manufacturer Price & Lead Time
2132 PATTERNED WAFER DEFECT INSPECTION KLA-TENR Request Quote
259 Reticle Inspection KLA-TENR Request Quote
40-00088 SEM KLA-TENR Request Quote
6200 Surfscan KLA-TENR Request Quote
7000 SURFSCAN KLA-TENR Request Quote
7200 14352 SURFSCAN KLA-TENR Request Quote
7700 INSPECTION SYSTEM KLA-TENR Request Quote
ABI 2000 C4 KLA-TENR Request Quote
AIT Defect Metrology KLA-TENR Request Quote
ES30/ES25 ELECTRICAL LINE MONITORS KLA-TENR Request Quote
FT700 THIN FILM MEASUREMENT KLA-TENR Request Quote
FT750 Film Thickness Measurement tool KLA-TENR Request Quote
FT-750 THIN FILM MEASUREMENT KLA-TENR Request Quote
KLA-5011 Overlay precision measurement tool KLA-TENR Request Quote
KLA5107/8100CD CD-SEM KLA-TENR Request Quote
NC-110 Omnimap Metals Monitoring System KLA-TENR Request Quote
P-2 Profilometer KLA-TENR Request Quote
P-22 C4 KLA-TENR Request Quote
RS55 Resistivity Mapping Tool KLA-TENR Request Quote
SFS7700 PATTERNED WAFER INSPECTION KLA-TENR Request Quote
SL3-UV Line nditioner KLA-TENR Request Quote
SURFSCAN 7500 SURFACE SCANNER KLA-TENR Request Quote
SURFSCAN-6200 BARE WAFER PARTICLE UNTER KLA-TENR Request Quote
SURFSCAN7700 PATTERNED WAFER PARTICLE UNTER KLA-TENR Request Quote